Ramsey Universal USB I/O Connector

The Ramsey Universal USB I/O Connector is a professional-grade shielded USB feedthrough interface designed for RF shielded enclosures, screen rooms and EMC testing environments. Engineered to provide a fully shielded USB connection while maintaining enclosure integrity, it allows reliable USB communications to pass through RF-shielded barriers without compromising shielding performance. Designed for use in wireless device testing, digital forensics, EMC laboratories and research facilities, it offers a simple and cost-effective solution for USB connectivity in demanding RF environments.

Featuring dual USB Type-A receptacles and support for all major USB standards, including USB 3.1 Gen 2, USB 3.1 Gen 1, USB 3.0, USB 2.0 and USB 1.1, the connector supports data transfer speeds of up to 10 Gbps. Its rugged nickel-plated aluminium construction and RF-gasketed mounting system ensure reliable operation in professional testing and development environments.

Key Features

• Fully shielded USB Type-A to Type-A feedthrough connector
• Supports USB 3.1 Gen 2 data rates up to 10 Gbps
• Compatible with USB 3.1, USB 3.0, USB 2.0 and USB 1.1 devices
• Designed for RF shielded enclosures and screen rooms
• Single-hole RF-gasketed mounting system
• Rugged nickel-plated aluminium construction
• Screw-on bonded shielding cap for maximum shielding effectiveness
• Compact design minimises panel space requirements
• Suitable for retrofit and new enclosure installations
• Professional-grade Ramsey RF shielding technology

Applications

The Universal USB I/O Connector is ideal for environments where USB connectivity must be maintained while preserving RF shielding integrity, including:

• RF shielded test enclosures
• EMC and compliance testing laboratories
• Wireless device development and validation
• Cellular, Wi-Fi and Bluetooth testing
• Digital forensic laboratories
• Secure device analysis environments
• Research and development facilities
• Production testing systems
• Government and defence communications testing

Its universal compatibility allows a single connector solution to support virtually all USB devices, reducing the need for multiple interface types and simplifying enclosure design.

Technical Overview

The Ramsey Universal USB I/O Connector provides a passive, fully shielded USB feedthrough designed to maintain the physical shielding performance of an RF enclosure. Unlike standard bulkhead connectors, the unit incorporates an RF-gasketed mounting system and bonded shielding cover to minimise RF leakage through the enclosure wall while allowing high-speed USB communications to pass transparently between the inside and outside environments.

Supporting data transfer rates up to 10 Gbps, the connector accommodates modern SuperSpeed USB applications while remaining backwards compatible with earlier USB standards. The robust milled aluminium body, EMI gasket and shielded cover provide a durable and reliable solution for professional testing environments where maintaining shielding effectiveness is critical.

Whether used in EMC laboratories, wireless testing facilities or digital forensic environments, the Ramsey Universal USB I/O Connector delivers dependable high-speed USB connectivity while h